High Resolution Powder Diffraction Print

High Resolution Powder Diffraction (XRD):

High spatial resolution in a powder diffraction pattern allows for quantitative phase analyses, Rietveld structure refinement, and ab initio crystal structure solutions. We use focussing optics to obtain a sharp CuK?1 pattern with either a point or linear detector. Bruker’s DIFFRAC.EVA software is used for phase analysis and TOPAS is used for phase refinement, structure refinement, or ab initio structure solution.

Bruker D8 Advance, point detector, focussed Cu K?1

PanAlytical X’Pert Pro, linear X’Celerator detector, Cu K?1 / Co

 

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